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Kihoon Yang

Samsung

3

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Thermal degradation of DRAM retention time: Characterization and improving techniques

2004 IRPS | International Reliability Physics Symposium
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New process damage during the etching of small-contact on long floating conductor layer

2003 IRPS | International Reliability Physics Symposium
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Charge trapping induced DRAM data retention time degradation under wafer-level burn-in stress

2002 IRPS | International Reliability Physics Symposium
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