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Hsi-Yu Kuo
Hsi-Yu Kuo
TSMC
Electronic engineering
Engineering
Power domains
Spice
NMOS logic
2
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5
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A new mechanism of signal path charging damage across separated power domain deep N-Well interface
2018
IRPS | International Reliability Physics Symposium
Yu-Lin Chu
Hsi-Yu Kuo
Sheng-Fu Hsu
Y. S. Tsai
Ming-Yi Wang
Chuan-Li Chang
Bill Kiang
Kenneth Wu
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A CDM-like damage mechanism for multiple power domains fabricated with Deep N-well processes
2017
IRPS | International Reliability Physics Symposium
Yu-Lin Chu
Hsi-Yu Kuo
Jinn-Wen Young
Y. S. Tsai
Chin-Yuan Ko
Ming-Yi Wang
Chuan-Li Chang
Bill Kiang
Kenneth Wu
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Citations (4)
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