Old Web
English
Sign In
Acemap
>
authorDetail
>
Sung-Il Chang
Sung-Il Chang
Samsung
Electronic engineering
Flash memory
NAND gate
Charge trap flash
Logic gate
4
Papers
13
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Hole trap effect on time-dependent-dielectric breakdown (TDDB) of high-voltage peripheral nMOSFETs in flash memory application
2017
IRPS | International Reliability Physics Symposium
Guangfan Jiao
Sung-Kweon Baek
Kab-jin Nam
Sung-Il Chang
Siyeon Cho
Thomas Kauerauf
Chanho Lee
Seung Uk Han
Jin-soak Kim
Eun-ae Chung
Yoocheol Shin
Jun-Hee Lim
Yu-gyun Shin
Ki-Hyun Hwang
Show All
Source
Cite
Save
Citations (0)
A comprehensive study of degradation behavior of select transistors in the Charge Trap Flash memories
2010
IMW | International Memory Workshop
Byeong-In Choe
Sung-Il Chang
Chang-seok Kang
Jintaek Park
Joohyuck Chung
Youngwoo Park
Jung Dal Choi
Chilhee Chung
Show All
Source
Cite
Save
Citations (1)
New phenomena for the Lifetime Prediction of TANOS-based Charge Trap NAND Flash Memory
2010
DRC | Device Research Conference
Juhyung Kim
Chang-seok Kang
Sung-Il Chang
Jongyeon Kim
Younseok Jeong
Chan Park
Joo-Heon Kang
Sang Hoon Kim
Sun-Kyu Hwang
Byeong-In Choe
Jintaek Park
Ju-hyuck Chung
Youngwoo Park
Jung Dal Choi
Chilhee Chung
Show All
Source
Cite
Save
Citations (7)
Reliability Characteristics of TANOS (TaN/AlO/SiN/Oxide/Si)NAND Flash Memory with Rounded Corner (RC) Structure
2008
International Memory Workshop
Sung-Il Chang
Chang-Hyun Lee
Chang-seok Kang
Sanghun Jeon
Ju Hyung Kim
Byeong-In Choi
Youngwoo Park
Jintaek Park
Won-Seok Jeong
Jang-Hyun You
Bonghyun Choi
Jong-Sun Sel
Jae-Sung Sim
Yoocheol Shin
Jung Dal Choi
Won-Seong Lee
Show All
Source
Cite
Save
Citations (5)
1