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Michio Kurihara
Michio Kurihara
Toshiba
Electronic engineering
Microscopy
Spreading resistance profiling
Analytical chemistry
Materials science
2
Papers
4
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0
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Applications of site-specific scanning spreading resistance microscopy (SSRM) to failure analysis of production lines
2012
IWJT | International Workshop on Junction Technology
Youhei Hayase
K. Hara
Shinsuke Ogata
Li Zhang
Haruko Akutsu
Michio Kurihara
Kenji Norimatsu
Shinji Nagamine
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Direct visualization of anomalous-phosphorus diffusion in failure-bit gates of SRAM-load pMOSFETs with high-resolution scanning spreading resistance microscopy
2010
IEDM | International Electron Devices Meeting
Li Zhang
K. Hara
Atsuhiro Kinoshita
Tsuneyuki Hashimoto
Youhei Hayase
Michio Kurihara
Daisuke Hagishima
Takayuki Ishikawa
Shiro Takeno
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Citations (3)
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