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Kenji Norimatsu
Kenji Norimatsu
Toshiba
Electronic engineering
Analytical chemistry
MOSFET
Avalanche breakdown
Power MOSFET
3
Papers
9
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Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition
2015
Microelectronics Reliability
Koichi Endo
Kenji Norimatsu
T. Nakamura
Takashi Setoya
Koji Nakamae
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Citations (5)
Time resolved emission observation from top surface in avalanche breakdown of power MOSFET
2014
IRPS | International Reliability Physics Symposium
Koichi Endo
Kenji Norimatsu
K. Nakashima
Takashi Setoya
Shinji Nagamine
T. Nakamura
Kazushige Koshikawa
Koji Nakamae
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Citations (3)
Applications of site-specific scanning spreading resistance microscopy (SSRM) to failure analysis of production lines
2012
IWJT | International Workshop on Junction Technology
Youhei Hayase
K. Hara
Shinsuke Ogata
Li Zhang
Haruko Akutsu
Michio Kurihara
Kenji Norimatsu
Shinji Nagamine
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Citations (1)
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