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P. Ndai
P. Ndai
Texas Instruments
Electronic engineering
CMOS
Reflow soldering
Data retention
Computer science
2
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22
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180nm FRAM reliability demonstration with ten years data retention at 125°C
2013
IRPS | International Reliability Physics Symposium
J. Rodriguez
J. Rodriguez-Latorre
C. Zhou
Archana Venugopal
Antonio Guillermo Acosta
M. Ball
P. Ndai
Sudhir K. Madan
Hugh P. McAdams
K. R. Udayakumar
Scott R. Summerfelt
Tamer San
Theodore S. Moise
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Citations (6)
Low-power ferroelectric random access memory embedded in 180nm analog friendly CMOS technology
2013
IMW | International Memory Workshop
K. R. Udayakumar
Tamer San
J. Rodriguez
S. Chevacharoenkul
D. Frystak
J. Rodriguez-Latorre
C. Zhou
M. Ball
P. Ndai
Sudhir K. Madan
Hugh P. McAdams
Scott R. Summerfelt
Theodore S. Moise
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Citations (16)
1