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K. Onishi
K. Onishi
University of Texas at Austin
Materials science
soft breakdown
constant voltage
Optoelectronics
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Hard and soft-breakdown characteristics of ultra-thin HfO 2 under dynamic and constant voltage stress
2002
Young Hee Kim
K. Onishi
C. S. Kang
Rino Choi
Hag Ju Cho
R. Nieh
J. Han
S. Krishnan
A. Shahriar
Jack C. Lee
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