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Hard and soft-breakdown characteristics of ultra-thin HfO 2 under dynamic and constant voltage stress
Hard and soft-breakdown characteristics of ultra-thin HfO 2 under dynamic and constant voltage stress
2002
Young Hee Kim
K. Onishi
C. S. Kang
Rino Choi
Hag Ju Cho
R. Nieh
J. Han
S. Krishnan
A. Shahriar
Jack C. Lee
Keywords:
Materials science
soft breakdown
constant voltage
Optoelectronics
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