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Teng Chun Hsuan
Teng Chun Hsuan
Materials science
Optoelectronics
Cartography
Ellipsometry
Analytical chemistry
2
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2
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Advanced Spectroscopic Ellipsometry Application for Multi-Layers SiGe at 28nm Node and Beyond
2013
Teng Chun Hsuan
Yi-cheng Hu
Ming Chih Hsu
Dian-Zhen Zhan
Stan Yu
Chin Cheng Chien
Shao-Ju Chang
Sheng-Min Chiu
Chien-Jen Huang
Chao-Yu Cheng
Juli Cheng
Getin Raphael
Zhiming Jiang
Ygartua Carlos
Zhengquan Tan
Ray Hoobler
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High Quality Silicon Cap Layer for 28nm and Beyond PMOS Processes
2013
Chin I. Liao
Teng Chun Hsuan
Chin Cheng Chien
Michael Chan
Chan Lon. Yang
J. Y. Wu
Balasubramanian Ramachandran
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