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Stan Yu

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Advanced Spectroscopic Ellipsometry Application for Multi-Layers SiGe at 28nm Node and Beyond

2013
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High Quality SiGe:B of High Ge Layer for 14nm and Beyond FINFET Processes

2013
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Dissecting Accountability and Effectiveness of International Nongovernmental Organization (INGO) Work: Converging and Diverging Perspectives between Academia and the Field

2012
- Stan Yu
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