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Marcio De Almeida Valle
Marcio De Almeida Valle
Thin film
Birefringence
Refractive index
Sputtering
Optics
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Birefringence characterization of TiO2 thin films deposited by DC sputtering over tilted substrates
2004
SBMicro | Symposium on Microelectronics Technology and Devices
Hugo Puertas De Araujo
Sebastiao G. Dos Santos
Marcio De Almeida Valle
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