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Namatsu Hideo
Namatsu Hideo
Engineering physics
hot carrier reliability
Imagination
MOSFET
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擬MOSFETのためのSiカンチレバー上のカーボンマルチプローブ | 文献情報 | J-GLOBAL 科学技術総合リンクセンター
2006
Nagase Masao
Nakamatsu Kenichiro
Matsui Shinji
Namatsu Hideo
Yamaguchi Hiroshi
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シリコンナノワイア金属-酸化物-半導体電界効果トランジスタを用いた可変障壁を有する単一電子トンネル・トランジスタ
2006
Applied Physics Letters
Fujiwara Akira
Inokawa Hiroshi
Yamazaki Kenji
Namatsu Hideo
Takahashi Yasuo
M Zimmerman Neil
B Martin Stuart
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The influence of Water in Inter-Layer Dielectrics on Hot-Carrier Reliability in MOSFET’s.
1993
Shimoyama Nobuhiro
Machida Katsuyuki
Takahashi Yasuo
Namatsu Hideo
Minegishi Kazushige
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