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The influence of Water in Inter-Layer Dielectrics on Hot-Carrier Reliability in MOSFET’s.
The influence of Water in Inter-Layer Dielectrics on Hot-Carrier Reliability in MOSFET’s.
1993
Shimoyama Nobuhiro
Machida Katsuyuki
Takahashi Yasuo
Namatsu Hideo
Minegishi Kazushige
Keywords:
Engineering physics
hot carrier reliability
Imagination
MOSFET
Search engine
Computer science
Dielectric
inter layer
Chemical substance
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