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Leon Li-Yang Chen
Leon Li-Yang Chen
NXP Semiconductors
Artificial intelligence
Computer science
Pattern recognition
Wafer
Pattern recognition (psychology)
3
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2024
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Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering
2021
ETS | European Test Symposium
Katherine Shu-Min Li
Leon Li-Yang Chen
Ken Chau-Cheung Cheng
Peter Yi-Yu Liao
Sying-Jyan Wang
Andrew Yi-An Huang
Nova Cheng-Yen Tsai
Leon Chou
Gus Chang-Hung Han
Jwu-E Chen
Hsing-Chung Liang
Chun-Lung Hsu
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WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques.
2021
ITC | International Test Conference
Peter Yi-Yu Liao
Katherine Shu-Min Li
Leon Li-Yang Chen
Sying-Jyan Wang
Andrew Yi-Ann Huang
Ken Chau-Cheung Cheng
Nova Cheng-Yen Tsai
Leon Chou
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