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Gus Chang-Hung Han
Gus Chang-Hung Han
National Chung Hsing University
Pattern recognition
Artificial intelligence
Computer science
Scratch
Wafer
3
Papers
1
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0
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2024
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Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering
2021
ETS | European Test Symposium
Katherine Shu-Min Li
Leon Li-Yang Chen
Ken Chau-Cheung Cheng
Peter Yi-Yu Liao
Sying-Jyan Wang
Andrew Yi-An Huang
Nova Cheng-Yen Tsai
Leon Chou
Gus Chang-Hung Han
Jwu-E Chen
Hsing-Chung Liang
Chun-Lung Hsu
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PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques
2020
ETS | European Test Symposium
Katherine Shu-Min Li
Peter Yi-Yu Liao
Leon Chou
Ken Chau-Cheung Chen
Andrew Yi-Ann Huang
Sying-Jyan Wang
Gus Chang-Hung Han
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