Old Web
English
Sign In
Acemap
>
authorDetail
>
Atsushi Nakayama
Atsushi Nakayama
Toshiba
Dram
Computer science
Wafer testing
Electronic engineering
Embedded system
3
Papers
13
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Cantilever type probe card for at-speed memory test on wafer
2005
VTS | VLSI Test Symposium
Hitoshi Iwai
Atsushi Nakayama
Naoko Itoga
Kotaro Omata
Show All
Source
Cite
Save
Citations (8)
Post-packaging auto repair techniques for fast row cycle embedded DRAM
2004
ITC | International Test Conference
Osamu Wada
Toshimasa Namekawa
Hiroshi Ito
Atsushi Nakayama
Shuso Fujii
Show All
Source
Cite
Save
Citations (5)
Interface socket design methodology to generate embedded DRAM macros
2001
CICC | Custom Integrated Circuits Conference
Ryo Haga
Tetsuya Kaneko
Atsushi Nakayama
Shinji Miyano
Hiroyuki Takenaka
Kenji Numata
Hiroyuki Koinuma
Takehiko Hojo
Akikuni Sato
Toshiyuki Kouchi
Kenichiro Mimoto
Masaaki Tazawa
Tsutomu Ohkubo
Takanori Andou
Tetsuya Amano
Show All
Source
Cite
Save
Citations (0)
1