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I. P. Tyagulskyy
I. P. Tyagulskyy
National Academy of Sciences of Ukraine
Trapping
Condensed matter physics
Annealing (metallurgy)
Electroluminescence
Dielectric
4
Papers
38
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The effect of rare-earth clustering on charge trapping and electroluminescence in rare-earth implanted metal-oxide-semiconductor light-emitting devices
2010
Journal of Applied Physics
A. N. Nazarov
S. I. Tiagulskyi
I. P. Tyagulskyy
V.S. Lysenko
L. Rebohle
J. Lehmann
S. Prucnal
M. Voelskow
W. Skorupa
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Citations (27)
Electroluminescence, charge trapping and quenching in Eu implantes SiO2-Si structures
2009
Microelectronic Engineering
S. Tyagulskiy
I. P. Tyagulskyy
A. N. Nazarov
V.S. Lysenko
L. Rebohle
J. Lehmann
W. Skorupa
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Citations (2)
Correlation between electroluminescence and charge trapping in multi-color Eu implanted Si-based light-emitting diodes
2009
Physica E-low-dimensional Systems & Nanostructures
A. N. Nazarov
I. P. Tyagulskyy
S. Tyagulskiy
L. Rebohle
W. Skorupa
Johannes Biskupek
Ute Kaiser
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Citations (3)
Charge trapping characterization of MOCVD HfO2/p-Si interfaces at cryogenic temperatures
2007
Microelectronics Reliability
I. P. Tyagulskyy
I.N. Osiyuk
V.S. Lysenko
A. N. Nazarov
S. Hall
Octavian Buiu
Y. Lu
R. Pötter
Paul R. Chalker
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Citations (6)
1