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Tung-Tsun Chen
Tung-Tsun Chen
TSMC
Electronic engineering
CMOS
Electrical engineering
ISFET
Field-effect transistor
4
Papers
47
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Ge CMOS gate stack and contact development for Vertically Stacked Lateral Nanowire FETs
2018
IEDM | International Electron Devices Meeting
M.J.H. van Dal
Georgios Vellianitis
Gerben Doornbos
B. Duriez
M. Holland
T. Vasen
Aryan Afzalian
E. Chen
S.K. Su
Tung-Tsun Chen
Tzer-Min Shen
Z.Q. Wu
Carlos H. Diaz
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Citations (20)
A 512×576 65-nm CMOS ISFET sensor for food safety screening with 123.8 mV/pH sensitivity and 0.01 pH resolution
2016
VLSIT | Symposium on VLSI Technology
Yu Jiang
Xu Liu
Tran Chien Dang
Mei Yan
Hao Yu
Jui-Cheng Huang
Cheng-Hsiang Hsieh
Tung-Tsun Chen
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Citations (5)
InAs nanowire GAA n-MOSFETs with 12–15 nm diameter
2016
VLSIT | Symposium on VLSI Technology
T. Vasen
P. Ramvall
Aryan Afzalian
Claes Thelander
Kimberly A. Dick
M. Holland
Gerben Doornbos
Shih Wei Wang
Richard Kenneth Oxland
Georgios Vellianitis
M.J.H. van Dal
B. Duriez
J.-R. Ramirez
R. Droopad
Lars-Erik Wernersson
Lars Samuelson
Tung-Tsun Chen
Yee-Chia Yeo
Matthias Passlack
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Citations (16)
A 201 mV/pH, 375 fps and 512×576 CMOS ISFET sensor in 65nm CMOS technology
2015
CICC | Custom Integrated Circuits Conference
Yu Jiang
Xu Liu
Xiwei Huang
Jing Guo
Mei Yan
Hao Yu
Jui-Cheng Huang
Cheng-Hsiang Hsieh
Tung-Tsun Chen
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Citations (6)
1