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Cheng-Guo Chen
Cheng-Guo Chen
United Microelectronics Corporation
Electronic engineering
High-κ dielectric
Optoelectronics
Attenuation length
Insulator (electricity)
4
Papers
42
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Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
2014
Japanese Journal of Applied Physics
Shih Chang Tsai
San-Lein Wu
Po Chin Huang
Bo Chin Wang
Kai-Shiang Tsai
Tsung-Hsien Kao
Chih-Wei Yang
Cheng-Guo Chen
Osbert Cheng
Yean-Kuen Fang
Shoou-Jinn Chang
Jone-Fang Chen
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Citations (2)
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
2014
Journal of Nanomaterials
Shih Chang Tsai
San-Lein Wu
Jone-Fang Chen
Bo Chin Wang
Po Chin Huang
Kai-Shiang Tsai
Tsung-Hsien Kao
Chih-Wei Yang
Cheng-Guo Chen
Kun Yuan Lo
Osbert Cheng
Yean-Kuen Fang
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Citations (1)
Comparison of the trap behavior between ZrO 2 and HfO 2 gate stack nMOSFETs by 1/f noise and random telegraph noise
2013
IEEE Electron Device Letters
Bo Chin Wang
San-Lein Wu
Yu Ying Lu
Shoou-Jinn Chang
Jone-Fang Chen
Shih Chang Tsai
Che Hua Hsu
Chih-Wei Yang
Cheng-Guo Chen
Osbert Cheng
Po Chin Huang
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Citations (27)
A Novel “hybrid” high-k/metal gate process for 28nm high performance CMOSFETs
2009
IEDM | International Electron Devices Meeting
Chien-Ming Lai
Chun-Hsien Lin
Li-Wei Cheng
Che Hua Hsu
Jung-Tsung Tseng
Tian-Fu Chiang
Cheng-Hsien Chou
Yiwei Chen
Chih-Hao Yu
Shao-Hua Hsu
Cheng-Guo Chen
Zhi-Cheng Lee
J. F. Lin
C.L. Yang
Guang-Hwa Ma
S. C. Chien
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Citations (12)
1