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Yu Ying Lu
Yu Ying Lu
Cheng Shiu University
Electronic engineering
Oxide
Analytical chemistry
Transistor
Semiconductor
5
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45
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Investigation of Low-Frequency Noise in High-k First/Metal Gate Last HfO 2 and ZrO 2 nMOSFETs
2014
San-Lein Wu
Bo Chin Wang
Yu Ying Lu
Shih-Chang Tsai
Jone-Fang Chen
Shoou-Jinn Chang
Sheng-Po Chang
Che Hua Hsu
Chih-Wei Yang
Cheng-Guo Chen
Osbert Cheng
Po Chin Huang
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Characterization of Oxide Traps in 28 nm n-Type Metal–Oxide–Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
2013
Japanese Journal of Applied Physics
Bo Chin Wang
San-Lein Wu
Yu Ying Lu
Chien Wei Huang
Chung-Yi Wu
Yu Min Lin
Kun Hsien Lee
Osbert Cheng
Po Chin Huang
Shoou-Jinn Chang
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Citations (3)
Comparison of the trap behavior between ZrO 2 and HfO 2 gate stack nMOSFETs by 1/f noise and random telegraph noise
2013
IEEE Electron Device Letters
Bo Chin Wang
San-Lein Wu
Yu Ying Lu
Shoou-Jinn Chang
Jone-Fang Chen
Shih Chang Tsai
Che Hua Hsu
Chih-Wei Yang
Cheng-Guo Chen
Osbert Cheng
Po Chin Huang
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Citations (27)
Correlation Between Random Telegraph Noise and $ \hbox{1}/f$ Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain
2012
IEEE Electron Device Letters
Bo Chin Wang
San-Lein Wu
Chien Wei Huang
Yu Ying Lu
Shoou-Jinn Chang
Yu Min Lin
Kun Hsien Lee
Osbert Cheng
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Citations (12)
Characterization of Oxide Tarps in 28 nm p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
2012
Japanese Journal of Applied Physics
Bo Chin Wang
San-Lein Wu
Chien Wei Huang
Yu Ying Lu
Shoou-Jinn Chang
Yu Min Lin
Kun Hsien Lee
Osbert Cheng
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Citations (3)
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