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W. Guo
W. Guo
IMEC
Electronic engineering
Materials science
Transistor
CMOS
Saturation current
3
Papers
8
Citations
0
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Noise coupling between TSVs and active devices: Planar nMOSFETs vs. nFinFETs
2015
ECTC | Electronic Components and Technology Conference
X. Sun
A. Rouhi Najaf Abadi
W. Guo
K. Ben Ali
M. Rack
C. Roda Neve
Munkang Choi
Victor Moroz
I. De Wolf
Jean-Pierre Raskin
G. Van der Plas
Eric Beyne
P. Absil
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Citations (6)
Study of 3D process impact on advanced CMOS devices
2014
European Microelectronics and Packaging Conference
A. La Manna
W. Guo
S. Van Huylenbroeck
E. Sirignano
Vladimir Cherman
G. Van der Plas
B. De Wachter
Alain Phommahaxay
Anne Jourdain
Gerald Beyer
Eric Beyne
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Study of 3D process impact on advanced CMOS devices
2013
EMPC | European Microelectronics and Packaging Conference
A. La Manna
W. Guo
S. Van Huylenbroeck
E. Sirignano
Vladimir Cherman
G. Van der Plas
B. De Wachter
Alain Phommahaxay
Anne Jourdain
Gerald Beyer
Eric Beyne
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Citations (2)
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