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B. De Wachter

IMEC

6

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20

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Study of 3D process impact on advanced CMOS devices

2014 European Microelectronics and Packaging Conference
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Reliability study in capacitor less 1T-RAM cells on SOI

2010 SOI | International SOI Conference
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Substrate bias dependency of sense margin and retention in bulk FinFET 1T-DRAM cells

2010 ESSDERC | European Solid-State Device Research Conference
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Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates

2009 SOI | International SOI Conference
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Citations (16)