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An Chen

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6

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Erasing characteristics of Cu2O metal-insulator-metal resistive switching memory

2008 Applied Physics Letters
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A Temperature-Accelerated Method to Evaluate Data Retention of Resistive Switching Nonvolatile Memory

2008 IEEE Electron Device Letters
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Procédé de sélection des caractéristiques d'exploitation d'un dispositif de mémoire résistive

2007
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Erase mechanism for copper oxide resistive switching memory cells with nickel electrode

2006 IEDM | International Electron Devices Meeting
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