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W. A. Iff
W. A. Iff
Université Paris-Saclay
Metrology
Optical coherence tomography
Silicon
Optics
Ray tracing (graphics)
2
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5
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Progress in OCT-based Through Silicon Via (TSV) metrology
2019
Frontiers in Optics
W. A. Iff
J-P. Hugonin
Christophe Sauvan
Mondher Besbes
P. Chavel
G Vienne
L. Milord
Dario Alliata
E. Herth
P. Coste
A. Bosseboeuf
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