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J-P. Hugonin
J-P. Hugonin
Université Paris-Saclay
Metrology
Optoelectronics
Through-silicon via
Materials science
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Progress in OCT-based Through Silicon Via (TSV) metrology
2019
Frontiers in Optics
W. A. Iff
J-P. Hugonin
Christophe Sauvan
Mondher Besbes
P. Chavel
G Vienne
L. Milord
Dario Alliata
E. Herth
P. Coste
A. Bosseboeuf
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