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Yu-Yuan Ke
Yu-Yuan Ke
United Microelectronics Corporation
Wafer
Optoelectronics
Integrated circuit
Process optimization
Electronic engineering
2
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Advanced Inspection Methodology for the Maximum Extension of Nitride Test Wafer Recycling
2020
ASMC | Advanced Semiconductor Manufacturing Conference
Yu-Yuan Ke
Kuang-Hsiu Chen
Shin-Ru Chen
Guan-wei Huang
Wesley Yu
Po-Jen Chuang
Chun-Li Lin
Chih-Wei Huang
Jun-Ming Chen
Shao-Ju Chang
Nachiketa Janardan
Tung-Ying Lee
Ethan Chen
Chao-Yu Cheng
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Fast and accurate defect classification for CMP process monitoring
2019
ASMC | Advanced Semiconductor Manufacturing Conference
Yong-Yi Lin
Fu-shou Tsai
Li Chieh Hsu
Hsin Kuo Hsu
Chih-Yueh Li
Yu-Yuan Ke
Chih-Wei Huang
Jun Ming Chen
Shao-Ju Chang
Tung-Ying Lee
Ethan Chen
Chao-Yu Cheng
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