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Ann Swift
Ann Swift
IBM
Electronic engineering
Engineering
Logic gate
Metal gate
Dielectric
3
Papers
26
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0
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Using thermal cycle and temperature / voltage testing to reduce the incidence of resistive / open reliability defects
2014
IRPS | International Reliability Physics Symposium
Ann Swift
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Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
2012
IRPS | International Reliability Physics Symposium
Fen Chen
Steve Mittl
Michael A. Shinosky
Ann Swift
Rick Kontra
Brent A. Anderson
John M. Aitken
Yanfeng Wang
Emily R. Kinser
Mahender Kumar
Yun Wang
Terence Kane
Kai D. Feng
William K. Henson
Dan Mocuta
Di-An Li
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Reliability characterization of 32nm high-k metal gate SOI technology with embedded DRAM
2012
IRPS | International Reliability Physics Symposium
Steve Mittl
Ann Swift
Ernest Y. Wu
Dimitris P. Ioannou
Fen Chen
Greg Massey
Nilufa Rahim
Michael J. Hauser
Paul A. Hyde
Joe Lukaitis
Stew Rauch
Sudesh Saroop
Yanfeng Wang
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Citations (4)
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