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Kai D. Feng
Kai D. Feng
IBM
Electronic engineering
Integrated circuit
Engineering
Voltage
Debugging
5
Papers
30
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A method for rapid screening of various low-k TDDB models
2015
IRPS | International Reliability Physics Symposium
Fen Chen
Carole D. Graas
M. Shinosky
Chad M. Burke
Kai D. Feng
Craig Bocash
Ramachandran Muralidhar
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Citations (4)
Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
2012
IRPS | International Reliability Physics Symposium
Fen Chen
Steve Mittl
Michael A. Shinosky
Ann Swift
Rick Kontra
Brent A. Anderson
John M. Aitken
Yanfeng Wang
Emily R. Kinser
Mahender Kumar
Yun Wang
Terence Kane
Kai D. Feng
William K. Henson
Dan Mocuta
Di-An Li
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Citations (22)
Non-contact probing in millimeter wave transmitter characterizations
2009
ECTC | Electronic Components and Technology Conference
Hanyi Ding
Francis F. Szenher
Kai D. Feng
Randall M. Burnett
Andrea Paganini
Robert Michael Morton
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Testing methods for integrated circuit of phase locked loops
2007
ASICON | International Conference on ASIC
Kai D. Feng
Anjali R. Malladi
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Light-controllable room temperature negative differential resistance in deep-trench type nitride-oxide tunneling device and its applications
2002
Applied Physics Letters
Fen Chen
B. Li
Kai D. Feng
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Citations (2)
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