Old Web
English
Sign In
Acemap
>
authorDetail
>
J. H. Lee
J. H. Lee
TSMC
Static random-access memory
Physics
Bit cell
Electronic engineering
Instability
3
Papers
7
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
A Reliability Enhanced 5nm CMOS Technology Featuring 5 th Generation FinFET with Fully-Developed EUV and High Mobility Channel for Mobile SoC and High Performance Computing Application
2020
IEDM | International Electron Devices Meeting
J.C. Liu
S. Mukhopadhyay
Amit Kundu
Shu-Han Chen
Hsi-Ching Wang
D. S. Huang
J. H. Lee
M.I. Wang
Ryan Lu
Shy-Jay Lin
Yung-Shun Chen
H. L. Shang
Ping-Wei Wang
H. C. Lin
Geoffrey Yeap
Jun He
Show All
Source
Cite
Save
Citations (1)
Modeling of BTI-aging V T stability for advanced planar and FinFET SRAM reliability
2017
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Y.-H. Lee
J. H. Lee
Y. S. Tsai
S. Mukhopadhyay
Y.F. Wang
Show All
Source
Cite
Save
Citations (4)
Enhanced SEM Doping Contrast
2003
C.Y. Lin
J. H. Lee
Show All
Source
Cite
Save
Citations (2)
1