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K. Hikazutani
K. Hikazutani
Fujitsu
Materials science
Atom
X-ray photoelectron spectroscopy
Analytical chemistry
Nitrogen
4
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11
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Depth profiling of oxynitride film formed on Si(1 0 0) by photon energy dependent photoelectron spectroscopy
2003
Applied Surface Science
K. Nishizaki
Hiroshi Nohira
K. Takahashi
N. Kamakura
Yasutaka Takata
S. Shin
Keisuke Kobayashi
Naoyoshi Tamura
K. Hikazutani
Tatsuya Hattori
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Citations (3)
Compositional depth profiling of ultrathin oxynitride/Si interface using XPS
2002
Applied Surface Science
Hirohisa Kato
K. Nishizaki
K. Takahashi
Hiroshi Nohira
Naoyoshi Tamura
K. Hikazutani
Seiji Sano
Takeo Hattori
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Citations (7)
Surface and interface morphologies of ultrathin oxynitrides films formed on Si(100)
2001
Keita Furuno
Kouta Inoue
K. Nishizaki
Hirohisa Kato
K. Takahashi
Hiroshi Nohira
Naoyoshi Tamura
K. Hikazutani
Seiji Sano
Takeo Hattori
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Chemical Structures of Oxynitrides/Si(100) Interface
2000
The Japan Society of Applied Physics
Hirohisa Kato
K. Takahashi
H. Nohira
Naoyoshi Tamura
K. Hikazutani
Seiji Sano
Takeo Hattori
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Citations (1)
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