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Seiji Sano
Seiji Sano
Fujitsu
Analytical chemistry
Nitrogen
Atom
X-ray photoelectron spectroscopy
Materials science
5
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20
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Compositional depth profiling of ultrathin oxynitride/Si interface using XPS
2002
Applied Surface Science
Hirohisa Kato
K. Nishizaki
K. Takahashi
Hiroshi Nohira
Naoyoshi Tamura
K. Hikazutani
Seiji Sano
Takeo Hattori
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Citations (7)
Interface Roughness Produced by Nitrogen Atom Incorporation at a SiO2/Si(100) Interface
2001
Japanese Journal of Applied Physics
Kouta Inoue
Keita Furuno
Hirohisa Kato
Naoyoshi Tamura
Kenichi Hikazutani
Seiji Sano
Takeo Hattori
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Citations (12)
Interface Roughness Produced by Nitrogen Atom Incorporation at a SiO_2/Si(100) Interface : Semiconductors
2001
Japanese Journal of Applied Physics
Kouta Inoue
Keita Furuno
Hirohisa Kato
Naoyoshi Tamura
Kenichi Hikazutani
Seiji Sano
Takeo Hattori
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Surface and interface morphologies of ultrathin oxynitrides films formed on Si(100)
2001
Keita Furuno
Kouta Inoue
K. Nishizaki
Hirohisa Kato
K. Takahashi
Hiroshi Nohira
Naoyoshi Tamura
K. Hikazutani
Seiji Sano
Takeo Hattori
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Chemical Structures of Oxynitrides/Si(100) Interface
2000
The Japan Society of Applied Physics
Hirohisa Kato
K. Takahashi
H. Nohira
Naoyoshi Tamura
K. Hikazutani
Seiji Sano
Takeo Hattori
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Citations (1)
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