Old Web
English
Sign In
Acemap
>
authorDetail
>
K.P. Lee
K.P. Lee
Samsung
Optoelectronics
Electronic engineering
Dram
Transistor
PMOS logic
4
Papers
5
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Trap Density Modulation for IO FinFET NBTI Improvement
2020
IRPS | International Reliability Physics Symposium
Rakesh Ranjan
Charles B. LaRow
K.P. Lee
Minhyo Kang
Pavitra R. Perepa
M. Shahriar Rahman
Bong Ki Lee
David J. Moreau
Carolyn Cariss-Daniels
Timothy Basford
Colby Callahan
Maihan Nguyen
Gil-heyun Choi
Hyunchul Sagong
Hwa-Sung Rhee
Show All
Source
Cite
Save
Citations (1)
14nm FinFET process technology platform for over 100M pixel density and ultra low power 3D Stack CMOS Image Sensor
2019
IEDM | International Electron Devices Meeting
Donghee Yu
Jong-Won Choi
Sang-il Jung
Min-Ho Kwon
Il-Seon Ha
Chaesung Kim
Sanghyun Cho
Seung-Hyun Lim
Won-Woong Kim
Moo Young Kim
Seonghye Park
Choong jae Lee
K.P. Lee
Rakesh Ranjan
Shigenobu Maeda
Gitae Jeong
Myounkyu Park
Junghwan Park
Seungju Hwang
Joonhyung Lee
Sunghun Yu
Hyunjung Shin
Byoung-Ho Kim
Show All
Source
Cite
Save
Citations (2)
Memory cell capacitor using cross double patterning technology for gigabit density DRAM
2009
ISDRS | International Semiconductor Device Research Symposium
Cheon Bae Kim
Seong-Goo Kim
S.I. Cho
K.-S. Kim
K.P. Lee
Yong Han Roh
Show All
Source
Cite
Save
Citations (0)
Analysis of DRAM standby current failure due to Hot Electron Induced Punch-through (HEIP) of PMOS transistor
2005
Mann-Ho Cho
Y. I. Kim
J. Choi
D. S. Woo
K.P. Lee
Y.J. Park
W. S. Lee
B. I. Ryu
Show All
Source
Cite
Save
Citations (2)
1