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Donghee Yu
Donghee Yu
Samsung
Optoelectronics
NMOS logic
Transistor
Chip
Flicker noise
2
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2
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0
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Detection Analysis of Burn-in Socket Defects using a Daisy-chain Coplanar Waveguide
2021
IEIE Transactions on Smart Processing and Computing
Donghee Yu
Moonjung Kim
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14nm FinFET process technology platform for over 100M pixel density and ultra low power 3D Stack CMOS Image Sensor
2019
IEDM | International Electron Devices Meeting
Donghee Yu
Jong-Won Choi
Sang-il Jung
Min-Ho Kwon
Il-Seon Ha
Chaesung Kim
Sanghyun Cho
Seung-Hyun Lim
Won-Woong Kim
Moo Young Kim
Seonghye Park
Choong jae Lee
K.P. Lee
Rakesh Ranjan
Shigenobu Maeda
Gitae Jeong
Myounkyu Park
Junghwan Park
Seungju Hwang
Joonhyung Lee
Sunghun Yu
Hyunjung Shin
Byoung-Ho Kim
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