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K. W. Kwon
K. W. Kwon
Samsung
Analytical chemistry
Annealing (metallurgy)
Chemistry
Capacitor
Physics
4
Papers
41
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Investigation of Ge profile on SiGe islands by scanning photoelectron microscopy
2004
Journal of Vacuum Science & Technology B
Mann-Ho Cho
Yong Jai Cho
M.K. Lee
S. A. Park
Y. S. Roh
Y.K. Kim
KwangHo Jeong
Sung Mook Kang
Dae-Hong Ko
Hyun-Joon Shin
K. W. Kwon
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Citations (1)
Evolution of tungsten-oxide whiskers synthesized by a rapid thermal-annealing treatment
2004
Journal of Vacuum Science & Technology B
Mann-Ho Cho
S. A. Park
K. D. Yang
In-Whan Lyo
KwangHo Jeong
Sung Kwan Kang
Dae-Hong Ko
K. W. Kwon
J.-H. Ku
Sung Woon Choi
Hyun-Joon Shin
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Citations (26)
Highly manufacturable process technology for reliable 256 Mbit and 1 Gbit DRAMs
1994
IEDM | International Electron Devices Meeting
Ho Kyu Kang
Ki-chul Kim
Yun-Seung Shin
In Seon Park
K.M. Ko
Chang-Jung Kim
K.Y. Oh
Sung-Bong Kim
C.G. Hong
K. W. Kwon
J. Y. Yoo
Yeon-hee Kim
C. G. Lee
W.S. Paick
D.I. Suh
C.J. Park
S.I. Lee
S.T. Ahn
Chang-Gyu Hwang
Myoung-Bum Lee
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Citations (7)
Ta/sub 2/O/sub 5/ capacitors for 1 Gbit DRAM and beyond
1994
IEDM | International Electron Devices Meeting
K. W. Kwon
In Seon Park
D.H. Han
Eok-su Kim
S.T. Ahn
Myoung-Bum Lee
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Citations (7)
1