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J. Y. Yoo
J. Y. Yoo
Samsung
Analytical chemistry
X-ray photoelectron spectroscopy
Chemistry
Physics
Electronic engineering
4
Papers
21
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Characteristics of ultrathin SiO2 films using dry rapid thermal oxidation and Pt catalyzed wet oxidation
2003
Journal of Vacuum Science and Technology
Mann-Ho Cho
J. S. Shin
Y. S. Roh
In-Whan Lyo
KwangHo Jeong
C. N. Whang
J. S. Lee
J. Y. Yoo
N.I. Lee
K. Fujihara
Dae Won Moon
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Citations (4)
Chemical structure of ultrathin SiO2 film with nitrogen incorporated by remote nitrogen plasma
2002
Journal of Vacuum Science and Technology
Mann-Ho Cho
Y. S. Roh
C. N. Whang
KwangHo Jeong
Dae-Hong Ko
J. Y. Yoo
N.I. Lee
K. Fujihara
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High performance transistors with state-of-the-art CMOS technologies
1999
IEDM | International Electron Devices Meeting
Wook-Je Kim
Jong-Bong Ha
G.G. Lee
J.-H. Ku
Hyung-Gon Kim
Cheol Kim
C. J. Choi
T.H. Choe
J. Y. Yoo
Won-sang Song
Ju-Seop Park
S. H. Jeong
D.H. Baek
K. Fujihara
Hyon-Goo Kang
S.I. Lee
Myoung-Bum Lee
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Highly manufacturable process technology for reliable 256 Mbit and 1 Gbit DRAMs
1994
IEDM | International Electron Devices Meeting
Ho Kyu Kang
Ki-chul Kim
Yun-Seung Shin
In Seon Park
K.M. Ko
Chang-Jung Kim
K.Y. Oh
Sung-Bong Kim
C.G. Hong
K. W. Kwon
J. Y. Yoo
Yeon-hee Kim
C. G. Lee
W.S. Paick
D.I. Suh
C.J. Park
S.I. Lee
S.T. Ahn
Chang-Gyu Hwang
Myoung-Bum Lee
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Citations (7)
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