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Donald R. Baer

Pacific Northwest National Laboratory

207

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Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis

2021 Journal of Vacuum Science and Technology
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Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature

2020 Journal of Vacuum Science and Technology
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Proliferation of Faulty Materials Data Analysis in the Literature

2020 Microscopy and Microanalysis
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Vacancy ordering during selective oxidation of β-NiAl

2020 Materialia
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XPS guide: Charge neutralization and binding energy referencing for insulating samples

2020 Journal of Vacuum Science and Technology
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Positive and Negative Contributions of XPS to Reproducibility Issues

2019 Journal of Surface Analysis
- Donald R. Baer
- Mark H. Engelhard
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ISD3: a particokinetic model for predicting the combined effects of particle sedimentation, diffusion and dissolution on cellular dosimetry for in vitro systems

2018 Particle and Fibre Toxicology
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Investigation of Ion–Solvent Interactions in Nonaqueous Electrolytes Using in Situ Liquid SIMS

2018 Analytical Chemistry
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In Situ Mass Spectrometric Monitoring of the Dynamic Electrochemical Process at the Electrode–Electrolyte Interface: a SIMS Approach

2017 Analytical Chemistry
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Erratum: “Beam Damage of Poly(2-chloroethyl methylacrylate) [PCEMA] Films as Observed by X-ray Photoelectron Spectroscopy at 143 K, 303 K, and 373 K” [Surf. Sci. Spectra 10, 80 (2003)]

2017 Surface Science Spectra
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