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Alexander G. Shard

National Physical Laboratory

110

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Summary of ISO/TC 201 Technical Report 23173—Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings

2021 Surface and Interface Analysis
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Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis

2021 Journal of Vacuum Science and Technology
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Thickness measurement of nm HfO2 films

2021 Metrologia
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Measurement of Peptide Coating Thickness and Chemical Composition Using XPS.

2021 Methods of Molecular Biology
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ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)]

2021 Journal of Vacuum Science and Technology
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Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application In Situ Matrix-Enhanced Secondary Ion Mass Spectrometry.

2021 Analytical Chemistry
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Surface-Energy Control and Characterization of Nanoparticle Coatings

2020 Journal of Physical Chemistry C
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Ultraviolet–visible spectrophotometry

2020
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Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles

2020 Journal of Physical Chemistry C
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Protein identification by 3D OrbiSIMS to facilitate in situ imaging and depth profiling.

2020 Nature Communications
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