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Sven Tougaard

University of Southern Denmark

21

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75

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Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two- and three-parameter cross-sections

2021 Surface and Interface Analysis
- Charlotte Zborowski
- Sven Tougaard
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Using the inelastic background in hard x-ray photoelectron spectroscopy for a depth-resolved analysis of the CdS/Cu(In,Ga)Se2 interface

2021 Journal of Vacuum Science and Technology
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Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy

2021
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Proliferation of Faulty Materials Data Analysis in the Literature

2020 Microscopy and Microanalysis
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Optical properties of molybdenum in the ultraviolet andextreme ultraviolet from Reflection Electron EnergyLoss Spectroscopy

2020 Applied Optics
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Universal inelastic electron scattering cross‐section including extrinsic and intrinsic excitations in XPS

2020 Surface and Interface Analysis
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Effects of background gas composition and pressure on 1,4-polymyrcene (and polytetrafluoroethylene) spectra in near-ambient pressure XPS

2020 Surface Science Spectra
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Erratum: Determining the Thickness and Completeness of the Shell of Polymer Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry, and Transmission Scanning Electron Microscopy (The Journal of Physical Chemistry C (2019) 123:49 (29765−29775) DOI: 10.1021/acs.jpcc.9b09258)

2020 Journal of Physical Chemistry C
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Developments in Practical Applications of Inelastic Background Analysis to Characterize nano-structures

2019 Journal of Surface Analysis
- Sven Tougaard
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Inelastic scattering cross section of Si determined from angular dependent reflection electron energy loss spectra (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))

2009 Journal of Surface Analysis
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