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Detection Analysis of Burn-in Socket Defects using a Daisy-chain Coplanar Waveguide
Detection Analysis of Burn-in Socket Defects using a Daisy-chain Coplanar Waveguide
2021
Donghee Yu
Moonjung Kim
Keywords:
Coplanar waveguide
Daisy chain
Computer science
Optoelectronics
Burn-in
Correction
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