Old Web
English
Sign In
Acemap
>
authorDetail
>
Haiting Wang
Haiting Wang
GlobalFoundries
Electronic engineering
Engineering
Optoelectronics
Process variation
Polishing
3
Papers
1
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Impact of scribe line (kerf) defectivity on wafer yield
2018
ASMC | Advanced Semiconductor Manufacturing Conference
Fauzia Khatkhatay
Ludmila Popova
Chih-Chieh Huang
Hye Jin Lee
Yining Zang
Ki Cheol Ahn
ChiaHao Tsao
Tae Hoon Lee
Thirukumaran Mahalingam
Haiting Wang
Amit Gupta
Julie Lee
Towshif Ali
Joseph Matthew Kaule
Show All
Source
Cite
Save
Citations (1)
Reduction of "dark gate" defects in replacement-metal-gate process and middle-of-line contacts for advanced planar CMOS and FinFET technology
2016
CSTIC | China Semiconductor Technology International Conference
Wen Pin Peng
Min-Hwa Chi
Yang Zhang
Garo Jacques Derderian
Jeremy A. Wahl
Yue Hu
Yajiang Liu
Haiting Wang
John Lemon
Tao Wang
Jiwang Mao
Shi You
Show All
Source
Cite
Save
Citations (0)
1