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M. Dilliwar
M. Dilliwar
Thin film
Microstructure
X-ray optics
Diffraction
Residual stress
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Evaluation of microstructure and residual stress in W/B4C multilayer optics
2018
Journal of Applied Physics
A. Majhi
M. Dilliwar
P. C. Pradhan
S. Jena
M. Nayak
M. N. Singh
D. V. Udupa
N. K. Sahoo
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Citations (10)
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