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J. Herick
J. Herick
German National Metrology Institute
Electronic engineering
Physics
Calibration
Measurement uncertainty
Voltage
5
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5
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Towards a Metrology class ADC based on Josephson junction devices
2018
Allan Belcher
J.M. Williams
Jane Ireland
Ricardo Iuzzolino
Marcos E. Bierzychudek
Ronald Dekker
J. Herick
Ralf Behr
Kars Schaapman
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Design and Simulation of a High-Order Sigma-Delta Continuous-Time Modulator
2018
CPEM | Conference on Precision Electromagnetic Measurements
Ricardo Iuzzolino
Marcos E. Bicrzychudck
Allan Belcher
Ronald Dekker
J. Herick
J.M. Williams
Jane Ireland
Kars Schaapman
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Frequency-Dependent Verification of the Quantum Accuracy of a Quantum Voltage Noise Source
2018
CPEM | Conference on Precision Electromagnetic Measurements
M. Kraus
Oliver Kieler
Ralf Behr
J. Herick
S. Bauer
Luis Palafox
F. J. Ahlers
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Josephson Based Spectrum Analyzer
2018
CPEM | Conference on Precision Electromagnetic Measurements
Luis Palafox
J. Herick
Ralf Behr
Oliver Kieler
M. Schubert
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Calibration of an Inductive Voltage Divider Using Pulse-Driven Josephson Arrays
2018
CPEM | Conference on Precision Electromagnetic Measurements
J. Herick
S. Bauer
Ralf Behr
M. F. Beug
Oliver Kieler
Luis Palafox
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