Old Web
English
Sign In
Acemap
>
Paper
>
Towards a Metrology class ADC based on Josephson junction devices
Towards a Metrology class ADC based on Josephson junction devices
2018
Allan Belcher
J.M. Williams
Jane Ireland
Ricardo Iuzzolino
Marcos E. Bierzychudek
Ronald Dekker
J. Herick
Ralf Behr
Kars Schaapman
Keywords:
Josephson effect
Metrology
Electronic engineering
Physics
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
6
References
1
Citations
NaN
KQI
[]