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P.K. Tan
P.K. Tan
GlobalFoundries
Materials science
Electrical engineering
Computer science
Optoelectronics
Laser
5
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5
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Back End of Line (BEOL) Pulse Nanoprobing Fault Isolation Technique on RF Device with Soft Failure Issue
2020
P.K. Tan
C. Q. Chen
R. Fransiscus
A. Quah
P. T. Ng
S. M. Parab
Y.Z. Ma
R. He
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Simple Circuit Edit Passive Voltage Contrast Technique to Identify Leakage Location
2020
S. L. Ting
P.K. Tan
I. Withana
H. Tan
C. Q. Chen
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Failure Analysis on Inter Polysilicon Oxide Reliability Issues of 40nm Automotive NVM Device
2019
P.K. Tan
R. Fransiscus
Y. L. Pan
H. H. W. Thoungh
S. L. Ting
Y. Z. Zhao
T.L. Wee
H. Tan
S.P. Neo
C. Q. Chen
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Application of Laser Deprocessing Techniques in Physical Failure Analysis
2013
H. H. Yap
P.K. Tan
J. Lam
T. H. Ng
G. R. Low
R. He
H. Feng
Y. Z. Zhao
M. K. Dawood
H. Tan
Y. M. Huang
D. D. Wang
Z.H. Mai
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Top-Down Delayering with Planar Slicing Focus Ion Beam (TD-PS-XFIB)
2013
G. R. Low
P.K. Tan
T. H. Ng
H. H. Yap
H. Feng
R. He
H. Tan
M. K. Dawood
Y. M. Huang
D. D. Wang
Y. Z. Zhao
Y. Zhou
J. Lam
Z.H. Mai
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