author-photo

C. Savall

Centre national de la recherche scientifique

11

Papers

129

Citations

Citation Trend

Filter By

Papers (8) Sort By

Journal Conference Others

Tungsten Nitrides by PECVD: Some Chemical and Structural Characterizations

1998 Materials and Manufacturing Processes
Show All
- Source
- Cite
- Save
Citations (1)
RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films

1998 Applied Surface Science
Show All
- Source
- Cite
- Save
Citations (20)
Diamondlike carbon coatings : Chemical and morphological study by ERDA and AFM

1998 Surface Engineering
Show All
- Source
- Cite
- Save
Citations (1)
STM investigation of 2- and 3-dimensional Er disilicide grown epitaxially on Si(111)

1996 Surface Science
Show All
- Source
- Cite
- Save
Citations (25)
Initial growth mode of Er silicide on Si(111) by solid phase epitaxy

1996 Surface Science
Show All
- Source
- Cite
- Save
Citations (11)
Hydrogen and deuterium migration in annealed plasma-deposited silicon nitride films

1995 Thin Solid Films
- C. Savall
- J. C. Bruyère
Show All
- Source
- Cite
- Save
Citations (6)
Surface reconstruction of ErSi1.7(0001) investigated by scanning tunneling microscopy.

1995 Physical Review B
Show All
- Source
- Cite
- Save
Citations (33)
Room Temperature Photoluminescence Spectra of Annealed PECVD Silicon Nitride Thin Films

1992 MRS Proceedings
Show All
- Source
- Cite
- Save
Citations (5)