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D. Verkleij
D. Verkleij
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Electronic engineering
Process control
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1
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2024
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In-line TEM sample preparation and wafer return strategy for rapid yield learning
2006
N. Bicaïs-Lépinay
F. André
S. Brevers
P. Guyader
C. Trouiller
L.F.Tz. Kwakman
S. Pokrant
D. Verkleij
R. Schampers
L. Ithier
E. Sicurani
C. Wyon
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Citations (3)
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