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Mohamed El Kodadi
Mohamed El Kodadi
ASML Holding
Computer science
Metrology
Electronic engineering
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4
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3
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2024
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On-product focus monitoring and control for immersion lithography in 3D-NAND manufacturing
2020
Amine Lakcher
Ahmed Zayed
Jennifer Shumway
Jan-Pieter van Delft
Gratiela Isai
Ruxandra Mustata
Arno van den Brink
Taeddy Kim
Jay Jung
Yong-Sik Shin
Soo-Kyung Lee
Paul Böcker
Mohamed El Kodadi
Geert Vinken
Chanha Park
Sangjun Han
Jeongsu Park
Beomki Shin
Gunwoong Lee
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Improved control of multi-layer overlay in advanced 8nm logic nodes
2018
Tae-Sun Kim
Young-Sik Park
Yong-Chul Kim
Byoung-Hoon Kim
Ji-Hun Lee
Min-Keun Kwak
Sung-Won Choi
Joon-Soo Park
Hong-Cheon Yang
Philipp Meixner
Dong-jin Lee
Oh-Sung Kwon
Hyun-Su Kim
Jin-Tae Park
Sung-Min Lee
Cedric Desire Grouwstra
Vidar van der Meijden
Mohamed El Kodadi
Chris Kim
Pierre-Yves Guittet
Tjitte Nooitgedagt
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Scanner focus metrology and control system for advanced 10nm logic node
2018
Junghun Oh
Kwang-Seok Maeng
Jae-Hyung Shin
Won-woong Choi
Sung-Keun Won
Cedric Desire Grouwstra
Mohamed El Kodadi
Stephan Heil
Vidar van der Meijden
Jong Kyun Hong
Sang-Jin Kim
Oh-Sung Kwon
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