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James Hwang
James Hwang
Argonne National Laboratory
Electrical engineering
Capacitive sensing
Electronic engineering
Dielectric
Voltage
7
Papers
10
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Robustness of RF MEMS capacitive switches in Harsh Environments
2012
IMS | International Microwave Symposium
C.L. Goldsmith
James Hwang
Chris Gudeman
O. Auciello
J.L. Ebel
H.S. Newman
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Citations (6)
2008 IEEE MTT-S Technical Program
2008
Tohru Nagano
Masakatsu Nishigaki
Kingo Itaya
Takashi Kawakubo
Cristiano Palego
Stephen C. Hadler
Bora Baloglu
Zhen Peng
James Hwang
Herman F. Nied
David I. Forehand
Charles L. Goldsmith
Nikolaus Fichtner
Samuel Oliver Wane
Damienne Bajon
Peter Russer
Thilo Kaufmann
Christophe Fumeaux
Rudiger Vahldieck
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Acceleration of Dielectric Charging in RF MEMS Capacitive Switches (Preprint)
2006
Xiaobin Yuan
James Hwang
David I. Forehand
Charles L. Goldsmith
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A Model to Predict Transient Dielectric-Charging Effects in RF MEMS Capacitive Switches
2005
Xiaobin Yuan
James Hwang
David I. Forehand
Charles L. Goldsmith
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Citations (1)
A Model to Predict Temperature Acceleration of Dielectric-Charging Effects in RF MEMS Capacitive Switches (Preprint)
2005
Xiaobin Yuan
James Hwang
David I. Forehand
Charles L. Goldsmith
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