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J.L. Ebel
J.L. Ebel
Argonne National Laboratory
CMOS
Robustness (computer science)
Electrical engineering
Radiation
Capacitive sensing
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Robustness of RF MEMS capacitive switches in Harsh Environments
2012
IMS | International Microwave Symposium
C.L. Goldsmith
James Hwang
Chris Gudeman
O. Auciello
J.L. Ebel
H.S. Newman
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Citations (6)
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