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Yi Sun

Southern Methodist University

6

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15

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Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits.

2021 ITC | International Test Conference
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Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack

2019 Journal of Electronic Testing
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Test Architecture for Fine Grained Capture Power Reduction

2019 ICECS | International Conference on Electronics, Circuits, and Systems
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One more time! Increasing fault detection with scan shift capture

2018 NATW | North Atlantic Test Workshop
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Using Existing Reconfigurable Logic in 3D Die Stacks for Test

2016 NATW | North Atlantic Test Workshop
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